Jitter and Decision-level Noise Separation in A/D Converters

caroline11

Abstract
Gaussian aperture jitter leads to a reduced Signalto-Noise-Ratio of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new offchip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decisionlevel noise and the remaining random errors. By carrying out two tests at two diferent input frequencies and using the simulation results, errors induced by decision-level noise can be removed.