参考文献
SEMI G80-0200, "Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment"
Tektronix应用笔记:"Understanding and Characterizing Timing Jitter"
LeCroy白书:"The Accuracy of Jitter Measurements"
David Chandler, "hase Jitter-Phase Noise and VCXO", Corning Frequency Control Inc.