TSW1100评估模块（EVM）

GY@艳

TSW1100评估模块（EVM）主要用于数据采集。TSW1100数据采集速度高达170MSPS，高达16位的数据采集深度1万点深。它可以工作在双通道模式下运行允许的双屏同步捕获通道ADC 。数据通过USB接口传送使易PC的控制，它仅需要一个操作电源。Texas Instrument’s TSW1100 allows for high-speed digital data capture from Texas Instruments high speed, high-resolution analog-to-digital converters (ADC). It comes complete with software, allowing the user to quickly evaluate Texas Instruments ADCs without the need for expensive logic analyzers and complex analysis routines. The TSW1100 features data capture speeds of up to 170 MSPS and data capture depths of up to 16 x 1 million points. It can operate in dual-channel mode allowing simultaneous capture of a dual-channel ADC. Data is transferred via a USB interface allowing easy PC control and it requires only one power supply for operation. Consult the TSW1100 website for the list of compatible EVMs.